\valunit{10}{nm}
to \valunit{500}{nm} have been measured by femtosecond time-resolved pump-probe experiments. A conspicuous change of the relaxation behavior was found around \valunit{100}{nm} for pump pulse fluences of \valunit{1}{mJ/cm^{2}}. Thicker films show a nearly exponential decay of the transient linear reflectivity, which turns into a linear decay during the first \rangeunit{5}{7}{ps} for films with thicknesses of \valunit{100}{nm} or less. This observation is evidence of a mean free path of about \valunit{100}{nm} for hot electrons with temperatures around \valunit{1500}{K}.
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Received: 17 December 1996
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Hohlfeld, J., Müller, J., Wellershoff, SS. et al. Time-resolved thermoreflectivity of thin gold films and its dependence on film thickness. Appl Phys 64, 387–390 (1997). https://doi.org/10.1007/s003400050189
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DOI: https://doi.org/10.1007/s003400050189