Abstract
A physics-based Quantum-Modified CLassical Drift–Diffusion (QMCLDD) non-linear mathematical model has been developed for design and characterisation of GaN/AlGaN asymmetrical superlattice pin based single-pole single-throw (SPST) and single-pole multi-throw (SPMT) switches for sub-MM wave communication systems. The simulator has incorporated several important physical phenomena that arise in superlattice structure, including quantum confinement effects, generation-recombination and tunnelling generation of carriers as well as scattering limited carrier mobility and velocity in GaN/AlGaN structure. In order to reduce the dislocation density and in turn the series resistance in GaN/AlGaN heterostructure, thin AlN nucleation layer and a buffer layer are considered in the simulation. It is observed that the RF series resistance of the pin device, operating around 0.2 THz frequency regime, reduces in case of proposed superlattice structure. The advantages of super-lattice pin diode over the conventional Si devices are the faster reverse recovery time (~ 9 vs 35 ns) and lowering of forward RF series resistances (0.39 vs 1.20 Ω). This study also reveals that SPST and SPMT switches made up with super-lattice devices are characterized by low insertion loss (~ 0.13 and 0.15 dB, respectively) and high isolation (~ 65.4 and 82.5 dB, respectively). A good agreement between theory and experiment establishes the superiority of the present model over the others. A comparative analysis of Si and GaN/AlGaN super-lattice pin SPST and SPMT switches establishes the potential of the later for its application in high-frequency THz-communication. In addition to this, a detailed thermal modelling of the device has also been done to make the analysis more realistic. The junction temperature of the designed GaN/AlGaN superlattice pin switch will be as high as 377 K, which is quite moderate compared to its flat profile counterpart. To the best of authors’ knowledge, this is the first ever report on QMCLDD non-linear modelling of pin SPST and SPMT switches (series-shunt combination) at THz-arena.
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Abbreviations
- V(x,t):
-
Electric potential
- Jp,n(x,t):
-
Current density of hole and electron
- Na(x):
-
Acceptor concentration
- Nd(x):
-
Donor concentration
- GTn,p(x,t) :
-
Carrier generation rates
- αp,n :
-
Carrier ionization rates
- Cp,n(x,t):
-
Concentration of the charge carriers
- µp,n :
-
Mobility of hole and electron
- KB :
-
Boltzmann’s constant
- Tj :
-
Junction temperature
- Ei(x,t):
-
Electric field in the i-region
- h:
-
Planck’s constant
- W:
-
i-region width
- P(x,t):
-
Normalized current density
- QTp,n(x,t):
-
Quantum potential
- q:
-
Charge of electron
- ρ(x,t):
-
Volume charge density
- ni :
-
Intrinsic concentration
- Dn,p :
-
Diffusion constant of hole and electron
- Mm :
-
Modulation Index
- Vb :
-
Breakdown voltage
- DUT:
-
Device under test
- I:
-
Forward bias current
- V:
-
Applied voltage
- τ:
-
Carrier life time
- fa :
-
Design frequency
- L:
-
Diffusion length
- Rs :
-
Series resistance
- Ri :
-
Intrinsic resistance
- Rj(f):
-
Junction resistance
- i(t):
-
Transit time current
- IRM :
-
Reverse recovery current
- Pd :
-
Power dissipation
- Z0 :
-
Characteristic impedance
- Ta :
-
Ambient temperature
- θj :
-
Thermal impedance
- Cp :
-
Specific heat
- Vd :
-
Volume of the device
- HC :
-
Heat capacity
- Tth :
-
Thermal time constant
- tp :
-
On time of the applied pulse
- tr :
-
Total time duration of the applied pulse
- σ:
-
Conductivity
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Acknowledgements
Dr. M. Mukherjee wishes to acknowledge, Adamas University, for providing necessary infrastructure and facilities for conducting the research program.
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Kundu, A., Kanjilal, M.R. & Mukherjee, M. III–V super-lattice SPST/SPMT pin switches for THz communication: theoretical reliability and experimental feasibility studies. Microsyst Technol 27, 539–554 (2021). https://doi.org/10.1007/s00542-018-4053-5
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DOI: https://doi.org/10.1007/s00542-018-4053-5