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Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems

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Abstract

Recent years have seen the emergence of droplet-based microfluidic systems for safety-critical biomedical applications. In order to ensure reliability, microsystems incorporating microfluidic components must be tested adequately. In this paper, we investigate test planning and test resource optimization for droplet-based microfluidic arrays. We first formulate the test planning problem and prove that it is NP-hard. We then describe an optimization method based on integer linear programming (ILP) that yields optimal solutions. Due to the NP-hard nature of the problem, we develop heuristic approaches for optimization. Experimental results indicate that for large array sizes, the heuristic methods yield solutions that are close to provable lower bounds. These heuristics ensure scalability and low computation cost.

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Authors and Affiliations

  1. Department of Electrical & Computer Engineering, Duke University, Durham, NC, 27708

    Fei Su, Sule Ozev & Krishnendu Chakrabarty

Authors
  1. Fei Su
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  2. Sule Ozev
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  3. Krishnendu Chakrabarty
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Corresponding author

Correspondence to Fei Su.

Additional information

This research was supported in part by the National Science Foundation under grant number IIS-0312352. A preliminary version of this paper appeared in Proc. European Test Symposium. pp. 72–77, 2004

Fei Su received the B.E. and the M.S. degrees in automation from Tsinghua University, Beijing, China, in 1999 and 2001, respectively, and the M.S. degree in electrical and computer engineering from Duke University, Durham, NC, in 2003. He is now a Ph.D. candidate in electrical and computer engineering at Duke University. His research interests include design and testing of mixed-technology microsystems, electronic design automation, mixed-signal VLSI design, MEMS modeling and simulation.

Sule Ozev received her B.S. degree in Electrical Engineering at Bogazici University in 1995, and her M.S. and Ph.D. degrees in Computer Science and Engineering at University of California, San Diego in 1998 and 2002 respectively. Since 2002, she has been a faculty member at Duke University, Electrical and Computer Engineering Department. Her research interests include RF circuit analysis and testing, process variability analysis, and mixed-signal testing.

Krishnendu Chakrabarty received the B. Tech. degree from the Indian Institute of Technology, Kharagpur, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995, respectively, all in Computer Science and Engineering. He is now Associate Professor of Electrical and Computer Engineering at Duke University. Dr Chakrabarty is a recipient of the National Science Foundation Early Faculty (CAREER) award and the Office of Naval Research Young Investigator award. His current research projects include: design and testing of system-on-chip integrated circuits; design automation of microfluidics-based biochips; microfluidics-based chip cooling; distributed sensor networks. Dr Chakrabarty has authored three books Microelectrofluidic Systems: Modeling and Simulation (CRC Press, 2002), Test Resource Partitioning for System-on-a-Chip (Kluwer, 2002), and Scalable Infrastructure for Distributed Sensor Networks (Springer, 2005) 3/4 and edited the book volume SOC (System-on-a-Chip) Testing for Plug and Play Test Automation (Kluwer 2002). He has published over 200 papers in journals and refereed conference proceedings, and he holds a US patent in built-in self-test. He is a recipient of best paper awards at the 2005 IEEE International Conference on Computer Design and 2001 IEEE Design, Automation and Test in Europe (DATE) Conference. He is also a recipient of the Humboldt Research Fellowship, awarded by the Alexander von Humboldt Foundation, Germany.

Dr Chakrabarty is an Associate Editor of IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on VLSI Systems, IEEE Transactions on Circuits and System I, ACM Journal on Emerging Technologies in Computing Systems, and an Editor of Journal of Electronic Testing: Theory and Applications (JETTA). He a member of the editorial board for Sensor Letters and Journal of Embedded Computing and he serves as a subject area editor for the International Journal of Distributed Sensor Networks. He has also served as an Associate Editor of IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing. He is a senior member of IEEE, a member of ACM and ACM SIGDA, and a member of Sigma Xi. He serves as Vice Chair of Technical Activities in IEEE’s Test Technology Technical Council, and is a member of the program committees of several IEEE/ACM conferences and workshops. He served as the Program Co-Chair for the 2005 IEEE Asian Test Symposium.

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Su, F., Ozev, S. & Chakrabarty, K. Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems. J Electron Test 22, 199–210 (2006). https://doi.org/10.1007/s10836-005-1256-3

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  • DOI: https://doi.org/10.1007/s10836-005-1256-3

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