Abstract
Fe2O3 of particle sizes ranging from 120 to 20 nm has been prepared by the ball-milling process using different milling hour. X-ray diffraction technique and transmission electron microscopy have been used for determining the average particle sizes of the prepared samples. Direct optical band gap for the unmilled and the ball-milled samples has been calculated from the optical absorption data. A red shift in the band gap due to the reduction of particle size has been observed. The coincidence Doppler broadening of the electron positron annihilation γ-radiation spectroscopy has been employed to identify the nature of defects generated due to the ball-milling process.
Similar content being viewed by others
References
Henglin A (1989) Chem Rev 89:1861
Hinds KA et al (2003) Blood 102:867; Rudge SR, Kurtz TL, Vessely CR, Catterall LG, Williamson DL (2000) Biomaterials 21:1411
Jones DH (1989) Hyperfine Interact 47:289
Mimura N, Takahara I, Saito M, Hattori T, Ohkuma K, Ando M (1998) Catal Today 45:61
Huo L, Li W, Lu L, Cui H, Xi S, Wang J, Zhao B, Shen Y, Lu Z (2000) Chem Mater 12:790
Zboril R, Mashlan M, Petridis D (2002) Chem Mater 14:969
Pascual R, Sayer M, Kumar CVRV, Zou L (1991) J Appl Phys 70:2348
Wang X, Chen X, Ma XC, Zheng H, Ji M, Zhang Z (2004) Chem Phys Lett 384:391
Kim ET, Yoon SG (1993) Thin Solid Films 227:7
Bokhimi X, Morales A, Portilla M, Gracia-Ruiz A (1999) Thin Solid Films 12:589
Luo WG, Ding AL, Li H (1995) Integr Ferroelectr 9:75
Birringer R, Gleiter H, Klein HP, Marquardt P (1984) Phys Lett A 102:365
Michel D, Gaffet E, Berther P (1995) Nanostruct Mater 6:667
Chakrabarti M, Bhowmick D, Sarkar A, Chattopadhyay S, Dechoudhury S, Sanyal D, Chakrabarti A (2005) J Mater Sci 40:5265. doi:https://doi.org/10.1007/s10853-005-0743-3
Chakrabartii M, Dutta S, Chattopadhyay S, Sarkar A, Sanyal D, Chakrabarti A (2004) Nanotechnology 15:1792
Zhang BQ, Lu L, Lai MO (2003) Physica B 325:120
Hautojarvi P, Corbel C (1995) In: Dupasquier A, Mills AP Jr (eds) Positron spectroscopy of solids. IOS Press, Amsterdam, p 491; In: Krause-Rehberg R, Leipner HS (eds) Positron annihilation in semiconductors, Springer Verlag, Berlin, 1999
Lynn KG, Goland AN (1976) Solid State Commun 18:1549
Williamson GK, Hall WH (1953) Acta Metall 1:22
Chakrabarti M, Sarkar A, Chattopadhyay S, Sanyal D (2006) In: Martins BP (ed) New topics in superconductivity research. Nova Science, New York
Chakrabarti M, Sanyal D, Chakrabarti A (2007) J Phys Condens Matter 19:236210
Sanyal D, Chakrabarti M, Roy TK, Chakrabarti A (2007) Phys Lett A 371:482
Pancove J (1979) Optical processes in semiconductors. Prentice-Hall, Englewood Cliffs, NJ
Dakhel AA, Henari FZ (2003) Cryst Res Technol 38:979
Tauc J (1970) Mater Sci Bull 5:72
Dutta S, Chattopadhyay S, Sutradhar M, Sarkar A, Chakrabarti M, Sanyal D, Jana D (2007) J Phys Condens Matter 19:236218
Srikant V, Clarke DR (1997) J Appl Phys 81:6357
Puska MJ, Nieminen RM (1994) Rev Mod Phys 66:841
Myler U, Simpson PJ (1997) Phys Rev B 56:14303
Acknowledgements
M. Chakrabarti and M. Sutradhar gratefully acknowledge CSIR, Government of India, for providing financial assistance. A. Banerjee gratefully acknowledges Prof. S. K. Pradhan, Department of Physics, Burdwan University, for his valuable suggestions. The authors are thankful to Prof. G. N. Mukherjee, Department of Chemistry, University of Calcutta, for the optical measurement. The authors are also thankful to Mr. P. Ray, SINP, Kolkata, for the TEM measurement and A. Kar Mahapatra, SINP, Kolkata, for the XRD measurement.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Chakrabarti, M., Banerjee, A., Sanyal, D. et al. Particle size dependence of optical and defect parameters in mechanically milled Fe2O3. J Mater Sci 43, 4175–4181 (2008). https://doi.org/10.1007/s10853-008-2573-6
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10853-008-2573-6