Skip to main content
SpringerLink
Log in

Electrical studies on sputtered CuCl thin films

  • Published:
Journal of Materials Science: Materials in Electronics Aims and scope Submit manuscript

Abstract

CuCl is a wide-direct band gap semiconductor, lattice matched to Si and it possesses excellent ultra violet (UV) emission properties. It is thus a promising candidate for the next generation Si based UV optoelectronics. CuCl films were deposited using RF magnetron sputtering technique. X-ray diffraction analysis reveals that the grains are strongly <111> oriented. Triangular crystallites of CuCl were observed in the AFM surface topograph. Au–CuCl–Si–Au structures were fabricated and field dependent electrical studies were carried out in the electric field range of 1.25 × 106 to 2.5 × 107 V/m. I–V characteristics show that ohmic conduction prevails in low electric fields up to 2.5 × 106 V/m. In the higher field range, from 2.5 × 106 to 2.5 × 107 V/m, the conduction mechanism was Schottky emission controlled. There was no trap related charge transport observed at higher electric fields. Preliminary electrical studies are reported in this article.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5

Similar content being viewed by others

References

  1. W. Chen, M. Dumas, S. Ahsan, A. Kahn, C.B. Duke, A. Patton, J. Vac. Sci. Technol. A. 10, 2071 (1992)

    Article  CAS  Google Scholar 

  2. A. Yanase, Y. Segawa, Surf. Sci. 357–358, 885 (1996)

    Article  Google Scholar 

  3. A. Yanase, Y. Segawa, App. Surf. Sci. 130–132, 566 (1998)

    Article  Google Scholar 

  4. E. Vanagas, D. Brinkmann, J. Kudrna, O. Crégut, P. Gilliot, R. Tomasiunas, B. Hönerlage, J. Phys.: Condens. Matter. 14, 3627 (2002)

    Article  CAS  Google Scholar 

  5. R.S. Williams, D.K. Shuh, Y. Segawa, J. Vac. Sci. Technol. A. 6, 1950 (1988)

    Article  CAS  Google Scholar 

  6. N. Nishida, K. Saiki, A. Koma, Surf. Sci. 324, 149 (1995)

    Article  CAS  Google Scholar 

  7. G. Natarajan, S. Daniels, D.C. Cameron, L. O’Reilly, P.J. McNally, O. Lucas, I. Reid, R.T. Rajendra Kumar, A. Mitra, L. Bradley, J. Appl. Phys. 100, 033520 (2006)

    Article  Google Scholar 

  8. G. Natarajan, R.T. Rajendra Kumar, S. Daniels, D.C. Cameron, J. Appl. Phys. 100, 096108 (2006)

    Article  Google Scholar 

  9. L. O’Reilly, O.F. Lucas, P.J. McNally, A. Reader, G. Natarajan, S. Daniels, D.C. Cameron, A. Mitra, M. Martinz-Rosas, A.L. Bradley, J. Appl. Phys. 98, 113512 (2005)

    Article  Google Scholar 

  10. JCPDS Card no. 06-344, (International Centre for Diffraction, New York, 1997)

  11. A. Yanase, Y. Segawa, Surf. Sci. 357–358, 885 (1996)

    Article  Google Scholar 

  12. L. Maissel, R. Glang, Handbook of Thin Film Technology, (McGraw-Hill, New York, 1970)

    Google Scholar 

  13. S. Roberts, Phys. Rev. 76, 1215 (1949)

    Article  CAS  Google Scholar 

  14. I.P. Kaminow, E.H. Turner, Phys. Rev. B 5, 1564 (1972)

    Article  Google Scholar 

  15. J.E. Potts, R.C. Hanson, C.T. Walker, C. Schwab, Phys. Rev. B 9, 2711 (1974)

    Article  CAS  Google Scholar 

Download references

Acknowledgements

This project is funded by the Irish Research Council for Science Engineering and Technology (IRCSET) grant number SC/02/7. The authors would like to thank Mr. Billy Roarty for his technical support.

Author information

Authors and Affiliations

  1. Nanomaterials Processing Laboratory (NPL), School of Electronic Engineering, Dublin City University, Glasnevin, Dublin 9, Ireland

    Gomathi Natarajan, S. Daniels & P. J. McNally

  2. School of Physical Sciences, NCPST, Dublin City University, Dublin, Ireland

    R. T. Rajendra Kumar

  3. Advanced Surface Technology Research Laboratory (ASTRaL), Lappeenranta University of Technology, Lappeenranta, Finland

    D. C. Cameron

Authors
  1. Gomathi Natarajan
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. R. T. Rajendra Kumar
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. S. Daniels
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. D. C. Cameron
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. P. J. McNally
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Gomathi Natarajan.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Natarajan, G., Rajendra Kumar, R.T., Daniels, S. et al. Electrical studies on sputtered CuCl thin films. J Mater Sci: Mater Electron 19, 103–106 (2008). https://doi.org/10.1007/s10854-007-9310-9

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10854-007-9310-9

Keywords

Search

Navigation