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Variation of optical, structural, electrical and compositional properties of thermally evaporated CdTe thin films due to substrate temperature

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Abstract

Alteration of substrate temperature of thermally evaporated CdTe thin films can cause changes to the film structure and composition, affecting its optical, electrical as well as morphological properties. In this respect, polycrystalline CdTe thin films were deposited using thermal evaporation technique under different substrate temperatures from 125 to 300 °C. The optical, structural, compositional, morphological and electrical properties were studied using UV–visible spectroscopy, GIXRD, EDX, SEM and van der Pauw method, respectively. Optical measurements revealed that the band gap of the films slightly increase with increasing substrate temperature. Structurally, the lattice parameter and the crystallite size of the CdTe films deposited under a substrate temperature of 200 °C was found to be considerably higher than the rest of the substrate temperatures investigated. Texture coefficient indicate that the (111) plane becomes preferable as the substrate temperature is elevated to 300 °C. The lowest electrical resistivity was also found for samples deposited under a substrate temperature of 200 °C. Furthermore, EDX results reveals the composition of CdTe film considerably vary with respect to the substrate temperature at which the film was fabricated.

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Acknowledgments

Financial assistance from National Science Foundation of Sri Lanka (NSF, RG/12/BS/03), Prof. S. Sivananthanthan of University of Illinois at Chicago, USA and the Postgraduate Institute of Science of University of Peradeniya, Sri Lanka are gratefully acknowledged. Prof. M.A.K.L. Dissanayake of National Institute of Fundamental Studies of Sri Lanka and Prof. K. Premaratne of Department of Physics at University of Peradeniya, Dr. C.V. Hettiarachchi of Department of Chemistry at University of Peradeniya, Dr. R. Dhere of Sivananthan Laboratories Inc., Bolingbrook, IL, USA, Mr. P.G.S.A. Bandara of University of Mississippi, Oxford, MS, USA, Mr. R.G.S.A. Perera of Measurement Units, Standards and Services Department in Sri Lanka, Mr. M.G.S.P. Amarasinghe and Mr. M.C. Abeysinghe of Department of Physics, University of Peradeniya and Dr. M. Nandasiri of Western Michigan University, USA, are acknowledged for their valuable suggestions, support and guidance.

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Authors and Affiliations

  1. Postgraduate Institute of Science, University of Peradeniya, Peradeniya, Sri Lanka

    P. K. K. Kumarasinghe, B. M. K. Pemasiri & B. S. Dassanayake

  2. Department of Physics and Astronomy, Western Michigan University, Kalamazoo, MI, 49008, USA

    Amila Dissanayake

  3. Department of Physics, University of Peradeniya, Peradeniya, Sri Lanka

    B. M. K. Pemasiri & B. S. Dassanayake

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  1. P. K. K. Kumarasinghe
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  2. Amila Dissanayake
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  3. B. M. K. Pemasiri
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  4. B. S. Dassanayake
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Correspondence to B. S. Dassanayake.

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Kumarasinghe, P.K.K., Dissanayake, A., Pemasiri, B.M.K. et al. Variation of optical, structural, electrical and compositional properties of thermally evaporated CdTe thin films due to substrate temperature. J Mater Sci: Mater Electron 28, 276–283 (2017). https://doi.org/10.1007/s10854-016-5521-2

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