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A simple method for characterizing mechanical property of nanowire arrays in atmospheric environment

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Abstract

An unique method based on atomic force microscopy (AFM) and resonance for accurately characterizing elastic modulus of nanowire (NW) arrays in atmospheric environment is demonstrated without destructing or manipulating the sample. By acquiring the topography images of the NW arrays under frequency tunable AC electric field through AFM noncontact scanning mode, the resonance frequency of NWs can be easily identified and elastic modulus of the NW arrays is further derived. The measurement mechanism is based on quantifying the AFM tip scanning depth in the spaces of NWs to achieve the information of vibration. For the first time, the elastic modulus of ZnO NWs synthesized by of hydrothermal method is measured to be 55.7 ± 8.3 GPa.

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Acknowledgments

This study was supported by Jiangsu Higher Vocational Education Teacher Training Center(CN) (Grant No. 2018GRGDYX101).

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Authors and Affiliations

  1. Department of Vehicle Engineering, Changzhou Vocational Institute of Mechatronic Technology, Changzhou, 213164, People’s Republic of China

    Feng Wang, Haidong Wu, Jingbin Song & Fengjiao Zhang

  2. Department of Basic Courses, Changzhou Vocational Institute of Mechatronic Technology, Changzhou, 213164, People’s Republic of China

    Hongxia Tian

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  1. Feng Wang
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  2. Hongxia Tian
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  3. Haidong Wu
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  4. Jingbin Song
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Correspondence to Feng Wang.

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Wang, F., Tian, H., Wu, H. et al. A simple method for characterizing mechanical property of nanowire arrays in atmospheric environment. J Mater Sci: Mater Electron 30, 9938–9944 (2019). https://doi.org/10.1007/s10854-019-01332-x

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  • DOI: https://doi.org/10.1007/s10854-019-01332-x

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