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In situ Measurements of Irradiation-Induced Creep of Nanocrystalline Copper at Elevated Temperatures

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Abstract

We have measured irradiation-induced creep on nanocrystalline copper micropillars at elevated temperatures. The micropillars, which were ≈1 µm in diameter and ≈2 µm in height, were fabricated from magnetron-sputtered nanocrystalline copper films. The micropillars were compressed during 2.0 MeV Ar+ bombardment and the deformation measured in situ by laser interferometry. The creep rate was measured over the stress range 10–120 MPa at ≈200°C. The results show linear relationships of creep rate with both applied stress and displacement rate, yielding a creep compliance of 0.07 dpa−1 GPa−1 (dpa:displacement per atom). The findings are in good agreement with the previous results obtained using a bulge test on free-standing thin film specimens.

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Acknowledgement

This research was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering under Award DEFG02-05ER46217. The work was carried out, in part, in the Frederick Seitz Materials Research Laboratory Central Facilities, University of Illinois.

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Authors and Affiliations

  1. Department of Mechanical Engineering, Middle East Technical University, 06800, Ankara, Turkey

    Sezer Özerinç

  2. Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA

    Robert S. Averback & William P. King

  3. Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA

    William P. King

Authors
  1. Sezer Özerinç
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  2. Robert S. Averback
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  3. William P. King
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Correspondence to Sezer Özerinç.

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Özerinç, S., Averback, R.S. & King, W.P. In situ Measurements of Irradiation-Induced Creep of Nanocrystalline Copper at Elevated Temperatures. JOM 68, 2737–2741 (2016). https://doi.org/10.1007/s11837-016-2077-9

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  • DOI: https://doi.org/10.1007/s11837-016-2077-9

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