Abstract
Ultra-thin films (1 and 3 monolayers) of Pd were deposited on the Au(111) surface and then characterized by X-ray photoelectron spectroscopy (XPS), X-ray excited Auger spectroscopy (XAES), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD). For the 1 ML Pd film annealed at 450 °C, XPS and XAES results indicated that Pd had diffused into the Au substrate. For the 3 ML Pd film deposited at room temperature, the comparison between experimental and theoretical XPD results indicated approximately 30% of the surface was formed by 2 ML Au layers, and 70% of the surface, by 1 ML Au layers.
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Acknowledgements
The authors would like to thank Ana C. F. Felippi for her assistance in part of the experiments. Work supported by FAPESP, CAPES, CNPq, (Brazilian funding agencies), and LNLS (SXS project #5759).
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Pancotti, A., Nascente, P.A.P., de Siervo, A. et al. Characterization of Ultra-Thin Films of Pd Deposited on Au(111). Top Catal 54, 70–76 (2011). https://doi.org/10.1007/s11244-011-9649-2
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DOI: https://doi.org/10.1007/s11244-011-9649-2