Skip to main content
Log in

High-k Dielectric Double Gate Junctionless (DG-JL) MOSFET for Ultra Low Power Applications- Analytical Model

  • Original Paper
  • Published:
Silicon Aims and scope Submit manuscript

Abstract

This paper describes the impression of low-k/high-k dielectric on the performance of Double Gate Junction less (DG-JL) MOSFET. An analytical model of the threshold voltage of DG-JLFET has been presented. Poisson’s equation is solved using the parabolic approximation to find out the threshold voltage. The effect of high-k on various performance parameters of N-type DG-JLFET is explored. The comparative analysis has been carried out between conventional gate oxide, multi oxide and high-k oxide in terms of Drain Induced Barrier Lowering (DIBL), threshold voltage, figure of merit (ION/IOFF) and sub-threshold slope (SS). The high-k oxide has shown superlative performance as compared to others. The results are further analyzed for various device structures. The DG-JLFET with HfO2 exhibits excellent attainment by mitigating the Short Channel Effects (SCEs). The significant reduction in off current makes the device suitable for ultra-low power applications. There is a 61.9 % and 34.29 % improvement in the figure of merit and sub-threshold slope in the proposed device as compared to other devices. The simulation of DG-JLFET is carried out using the Silvaco TCAD tool.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

Data Availability

The datasets generated and analyzed during the current study are not publicly available but may be available from the corresponding author on reasonable request.

Code Availability

The code used during this work is not available.

References

  1. Colinge JP (2012) Junctionless transistors. IEEE International Meeting for Future of Electron Devices, Kansai, Osaka, pp 1-2

  2. Baruah RK, Roy PP (2014) A dual-material gate junctionless transistor with high-k spacer for enhanced analog performance. IEEE Trans. Electron Devices 61(1):123–128. https://doi.org/10.1109/TED.2013.2292852

    Article  CAS  Google Scholar 

  3. Ganesh A, Goel K, Mayall JS, Rewari S (2021)Subthreshold analytical model of asymmetric gate stack triple metal gate all around MOSFET (AGSTMGAAFET)for improved analog applications. Silicon. https://doi.org/10.1007/s12633-021-01173-6

  4. Goel A, Rewari S, Verma S, Gupta RS (2019)GaN-basedDual-Metal Gate Stack Engineered Junctionless-Surrounding-Gate(DMSEJSG)MOSFET for high power applications. IEEE 16th India Council International Conference (INDICON), 1-4. https://doi.org/10.1109/INDICON47234.2019.9030261.

  5. Goel A, Rewari S, Verma S, Deswal SS, Gupta RS (2021)Dielectric modulated junctionless biotube FET (DM-JL-BT-FET) bio-sensor. IEEE Sens J 21(5):16731–16743. https://doi.org/10.1109/JSEN.2021.3077540

    Article  CAS  Google Scholar 

  6. Xie Q, Wang Z, Taur Y (2017)Analysis of Short-ChannelEffects in Junctionless DG MOSFET. IEEE Trans. Electron Devices 64(8):3511–3514. https://doi.org/10.1109/TED.2017.2716969

    Article  CAS  Google Scholar 

  7. Sharma A, Jain A, Pratap Y, Gupta RS (2016)Effect of High-Kand vacuum dielectrics as gate stack on junction less cylindrical surrounding gate MOSFET. Solid-StateElectron 123:26–32. https://doi.org/10.1016/j.sse.2016.05.016

  8. Goel A, Rewari S, Verma S, Gupta RS (2021)Modeling of shallow extension engineered dual metal surrounding gate (SEE-DM-SG) MOSFET gate-induceddrain leakage (GIDL). Indian J Phys 95(2):299–308. https://doi.org/10.1007/s12648-020-01704-8

    Article  CAS  Google Scholar 

  9. Nandi S, Srivastava S, Rewari S (2019)Dual metal Schottky barrier asymmetric gate stack cylindrical gate all around (DM-SB-ASMGS-CGAA) MOSFET for improved analog performance for high-frequencyapplication. Microsyst Technol. https://doi.org/10.1007/s00542-019-04577-y

    Article  Google Scholar 

  10. Goel A, Rewari S, Verma S, Gupta RS (2018)Dielectric modulated Triple Metal Gate All Around MOSFET (TMGAA)forDNA bio-moleculedetection. IEEE Electron Devices Kolkata Conference (EDKCON), 337-340. https://doi.org/10.1109/EDKCON.2018.8770406.

  11. Gupta N, Patel JB, Raghav AK (2015)A study of conventional and Junctionless MOSFET using TCAD simulations. IEEE Conference on Advanced Computing & Communication Technologies, Haryana, pp 53-56. https://doi.org/10.1109/ACCT.2015.51

  12. Goel A, Rewari S, Verma S, Gupta RS (2020)Novel dual-metalJunctionless nanotube field-effecttransistors for improved analog and low-noiseapplications. J Electron Mater 50:108–119. https://doi.org/10.1007/s11664-020-08541-9

    Article  CAS  Google Scholar 

  13. Goel A, Rewari S, Verma S, Gupta RS (2019)High-Kspacer dual metal gate stack Underlap Junctionless gate all around (HKDMGS-JGAA)MOSFET for high-frequencyapplications. Microsyst Technol 26:1697–1705. https://doi.org/10.1007/s00542-019-04715-6

  14. Rewari S (2020)Core-shellnanowire junctionless accumulation mode field-effecttransistor (CSN-JAM-FET) for high-frequencyapplications -Analytical Study. Silicon. https://doi.org/10.1007/s12633-020-00744-3.

  15. Goel A, Rewari S, Verma S, Gupta RS (2019)Shallow Extension Engineered Dual Material Surrounding Gate (SEE-DM-SG) MOSFET for improved gate leakages, analysis of circuit and noise performance. AEU -Int J Electron Commun 111:1–9. https://doi.org/10.1016/j.aeue.2019.152924

    Article  Google Scholar 

  16. Rewari S, Haldar S, Nath V, Deswal SS, Gupta RS (2016)Numerical modeling of the subthreshold region of junctionless double surrounding gate MOSFET (JLDSG). Superlattice Microstruct 90:8–19. https://doi.org/10.1016/j.spmi.2015.11.026

  17. Trevisoli RD, Doria RT, Souza MD, Das S, Ferain I, Pavanello MA (2012)Surface-potential-baseddrain current analytical model for triple-gatejunction-less nanowire transistors. IEEE Tran. Electron Devices 59(12):3510–3518. https://doi.org/10.1109/TED.2012.2219055

  18. Trevisoli RD, Doria RT, Souza MD, Pavanello MA (2013)A physically-basedthreshold voltage definition, extraction, and analytical model for junction-lessnanowire transistors. Solid-StateElectron 90:12–17. https://doi.org/10.1016/j.sse.2013.02.059

  19. Goel A, Rewari S, Verma S, Gupta RS (2019)Temperature-dependentgate-induced drain leakages assessment of dual-metalnanowire field-effecttransistor—analyticalmodel. IEEE Trans Electron Devices 66(5):2437–2445. https://doi.org/10.1109/TED.2019.2898444

  20. Goel A, Rewari S, Verma S, Gupta RS (2020)Physics-basedanalytic modeling and simulation of gate-induceddrain leakage and linearity assessment in dual-metaljunctionless accumulation nanotube FET (DM-JAM-TFET). Appl Phys A 126:1–14. https://doi.org/10.1007/s00339-020-03520-7

  21. (2020) ATLAS: 3D device simulator, SILVACO International, Santa Clara

  22. Kumar P, Vashisht M, Gupta N, Gupta R (2021)Subthreshold current modeling of stacked dielectric triple material cylindrical gate all around (SD-TM-CGAA) Junctionless MOSFET for low power applications. Silicon 13(9):1–9. https://doi.org/10.1007/s12633-021-01399-4

    Article  CAS  Google Scholar 

  23. Darwin S, Samuel TA (2019)A holistic approach on Junctionless dual material double gate (DMDG)MOSFET with high k gate stack for low power digital applications. Silicon 12:393–403. https://doi.org/10.1007/s12633-019-00128-2

    Article  CAS  Google Scholar 

  24. Ambika, Dhiman G (2019)Investigation of Junction-lessdouble gate MOSFET with High-kgate-oxide and metal gate layers. Int J Innov Technol Exploring Eng 8(6S3):289–292

    Google Scholar 

  25. Bavir M, Abbasi A, Orouji AA (2019) A simulation study of Junctionless double-gate metal-oxide-semiconductor field-effect transistor with symmetrical side gates. Silicon 12(7):1–10. https://doi.org/10.1007/s12633-019-00258-7

  26. Wang P, Zhuang Y, Li C, Liu Y, Jiang Z (2015)Potential-basedthreshold voltage and subthreshold swing models for junctionless double-gatemetal-oxide-semiconductorfield-effecttransistor with dual-materialgate. Int J Numer Model: Electron Netw Devices Fields 29(2):230–242. https://doi.org/10.1002/jnm.2067

Download references

Author information

Authors and Affiliations

Authors

Contributions

The idea of the research was conceptualized by Prashant Kumar and Neeraj Gupta carried out the analytical modeling and simulation of Junctionless MOSFET. The formal analysis and resources for the research were arranged by Munish Vashisht and Rashmi Gupta. Prashant Kumar also prepared the original draft of the paper and Neeraj Gupta did the review, proofreading and necessary editing in the article.

Corresponding author

Correspondence to Neeraj Gupta.

Ethics declarations

Conflicts of Interest/Competing Interests

The authors declare that there is no conflict of interest regarding the content of this article.

Ethics Approval

Not applicable.

Consent to Participate

All authors are agreed.

Consent for Publication

There are no details on an individual reported in the manuscript.

Additional information

Publisher’s Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Kumar, P., Vashishath, M., Gupta, N. et al. High-k Dielectric Double Gate Junctionless (DG-JL) MOSFET for Ultra Low Power Applications- Analytical Model. Silicon 14, 7725–7734 (2022). https://doi.org/10.1007/s12633-021-01525-2

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s12633-021-01525-2

Keywords

Navigation