Charge resolution of a Hungarian brand CR-39(MA-ND) detector exposed to A 84Kr beam of energy 0.45A GeV

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Abstract

The Hungarian brand CR-39(MA-ND) plastic has been irradiated with a 84Kr ion beam of energy 0.45A GeV and etched for four different etching times, viz. 4, 6, 8 and 12 h. The estimated charge resolution of a CR-39(MA-ND) detector for registering the nuclei 32 ⩽ Z⩽ 36 was found to be 0.18e which is close to our previous observation of the response with a CR-39(DOP) Pershore made plate exposed to a 1.88A GeV56Fe beam at the Lawrence Berkeley Laboratory's Bevalac. It was found that the estimated etch rate ratio VTVG is independent of etching time. The cone length and minor axis of the etch pits has been found to increase with etching time.

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