Elsevier

Vacuum

Volume 83, Issue 12, 11 August 2009, Pages 1448-1453
Vacuum

Irradiation induced effects on Ni3N/Si bilayer system

https://doi.org/10.1016/j.vacuum.2009.06.003Get rights and content

Abstract

The irradiation effect in Ni3N/Si bilayers induced by 100 MeV Au ions at fluence 1.5 × 1014 ions/cm2 was investigated at room temperature. Grazing incidence X-ray diffraction determined the formation of Ni2Si and Si3N4 phases at the interface. The roughness of the thin film was measured by atomic force microscopy. X-ray reflectivity was used to measure the thickness of thin films. X-ray photoelectron spectroscopy has provided the elemental binding energy of Ni3N thin films. It was observed that after irradiation (Ni 2p3/2) peak shifted towards a lower binding energy. Optical properties of nickel nitride films, which were deposited onto Si (100) by ion beam sputtering at vacuum 1.2 × 10−4 torr, were examined using Au ions. In-situ IV measurements on Ni3N/Si samples were also undertaken at room temperature which showed that there is an increase in current after irradiation.

Introduction

Irradiation of materials with ion beams can improve the optical, chemical and electrical properties [1], [2]. The ion beam technique, in various forms, has been applied to semiconductors, metals, ceramics, polymers and glasses in producing stable, metastable or even non-equilibrium phases. Ion beam mixing [3], [4], [5], [6], [7], [8], [9], [10] in elemental metal/metal and metal/semiconductor bilayers and multilayer systems has been investigated in order to understand the ion induced atom transport processes and the formation of intermetallic phases at the interface. The relative importance of various mixing mechanisms such as ballistic mixing, thermal spike mixing and radiation-enhanced diffusion, has been established. The transition between these various scenarios concerning the ion parameters (mass, energy and fluence) and thermodynamic properties and the temperature of the samples are being debated.

Several ion beams induced processing techniques such as ion implantation, ion beam mixing and ion beam assisted deposition have been developed which allow tailoring new materials or modifying the properties of thin films and near-surface bulk layers. A large number of studies on ion beam induced effects in metal/metal [11], [12] and metal/semiconductor bilayers have been carried out [13], [14], [15], [16]. These investigations include (i) production of stable and metastable alloys and silicides, (ii) improvements of the structural, optical and electrical properties. More recently, attention has shifted to ceramic materials such as carbides, nitrides and oxides to study the behavior of ceramics, ceramic/metal or ceramic/semiconductor bilayers under ion irradiation. For instance, metal nitrides are an important class of ceramic materials which are useful in high temperature and irradiation environments as protective coatings, electrical insulators and diffusion barriers.

Binary nitrides are an interesting set of compounds that display a wide range of properties such as thermal stability or electrical conductivity. Technologically important compounds are BN, AlN, Si3N4, WN, TiN and NbN, which have been well characterized. On the other hand, less known but potentially important are a number of covalent metal nitrides of limited thermal stability such as Sn3N4, Cu3N and Ni3N [17]. These nitrides decompose into elements, thus suggesting possible uses in metallization reactions, which could be of importance for the electronic industry. Sputtering at a low deposition rate and power density can generate crystalline nitrides of tin, copper and nickel.

The thermal decomposition of Ni3N was studied by Juza et al. [18] who found a pronounced decomposition at 440 °C of a sample at 5 °C/min. In a different study, Bernier [19], through the use of X-ray diffraction and magnetic measurements, detected the presence of a Ni4N phase (cubic phase) in the course of the thermal decomposition of Ni3N (hexagonal phase). Chemical analysis of the cubic phase showed a deficiency of nitrogen.

Xenon irradiation effects on the Ni3N/Si bilayers system were observed by Rissanen et al. [20], [21]. The dissociation and sputtering of Ni3N followed by diffusion of nitrogen were related to the small binding energy of this compound. At higher ion fluences, the formation of Ni2Si and Si3N4 phases was found at the interface.

The structure and magnetic properties of nickel nitride thin films were studied by Vempaire et al. [22]. The structural characterization was done by X-ray diffraction and magnetic characterization was performed using a SQUID susceptometer.

In the present work a more comprehensive study of Ni3N/Si bilayers irradiated with Au ions was designed to combine analytical methods sensitive to surface roughness and phase formation. The motivation for us to investigate the Ni3N/Si system was to study a rather light ceramic/semiconductor bilayers system under swift heavy ion irradiation. The Ni3N/Si bilayers system has been characterized by grazing incidence X-ray diffraction (GIXRD), X-ray reflectivity (XRR), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), UV–Vis spectroscopy and IV characteristics.

Section snippets

Experimental work and discussion

The experimental processes are discussed in the following sections.

Conclusion

Nickel nitride films on silicon substrate are synthesized using ion beam sputtering of pure nickel in a mixture N2/Ar discharge and different phases of Ni3N films are obtained by the irradiation of Au ions. It is observed from the GIXRD results that some new phases are introduced after irradiation. XRR measurements describe that the thickness of the irradiated film slightly decreases as compared to the as-deposited sample. AFM results show the increase in roughness of the irradiated thin film

Acknowledgement

The authors are thankful to the accelerator group of IUAC, New Delhi for delivering the required ion beam. The work was supported by UGC-DAE-CSR for providing the facilities of characterization of samples and CSIR, New Delhi for financial assistance.

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