Elsevier

CIRP Annals

Volume 53, Issue 2, 2004, Pages 657-684
CIRP Annals

Probing Systems in Dimensional Metrology

https://doi.org/10.1016/S0007-8506(07)60034-1Get rights and content

Abstract

Dimensional parameters are the most commonly encountered quality characteristics of workpieces. The measuring process for testing conformance of those characteristics contains the important sub-process of probing the surface. A huge variety of probing systems for performing different measurement tasks on the shop floor, as well as in the metrological environment, have been developed. In coordinate measuring machines (CMM) probing systems must ensure reproducibility of the sensing operation even in the sub-micrometer range. This paper describes requirements, different principles and characteristics of tactile probing systems in dimensional metrology, with examples of several probing systems that are used in practice.

REFERENCES (224)

  • A. Weckenmann et al.

    The Influence of Measurement strategy on the uncertainty of CMM-Measurements

    Annals of CIRP

    (1998)
  • W.T. Estler et al.

    Practical aspects of touch-trigger probe error compensation

    Precision Engineering

    (1997)
  • W.T. Estler et al.

    Error compensation for CMM touch-trigger probes

    Precision Engineering

    (1996)
  • A. Weckenmann et al.

    Functionality-oriented evaluation and sampling strategy in coordinate metrology

    Precision Engineering

    (1995)
  • P.C. Miguel et al.

    A review on methods for probe performance verification

    Measurement

    (1998)
  • S. Carmignato et al.

    A new method for Thread Calibration on Coordinate Measuring Machines

    Annals of CIRP

    (2003)
  • W.G. Weekers et al.

    Compensation for dynamic errors of coordinate measuring machines

    Measurement

    (1997)
  • W.G. Weekers et al.

    Assessment of dynamic errors of CMMs for fast probing

    Annals of CIRP

    (1995)
  • T. Busch et al.

    Fundamentals of Dimensional Metrology

    (1998)
  • Weckenmann, A., Ernst, R., Geus, D.A., 2000, Comparability of tactile and optical formmeasuring techniques with...
  • S. Weisig et al.

    Kombinierte optische und mechanische Antastung erweitert die Einsatzmoeglichkeiten von Koordinatenmess-geraeten

    Qualitaet und Zuverlaessigkeit

    (1989)
  • H.-D. Jacoby

    Entwicklung und Merkmale eines Dreikoordinaten-Messgeraets

    Zeitschrift fuer industrielle Fertigung

    (1979)
  • Lewis, A. J., 2003, A fully traceable miniature CMM with sub-micrometre uncertainty, Proceedings of SPIE Conference, p....
  • Zebrowska-Lucyk, S., 2000, Method of precise positioning of the pick-up stylus in computerised measurements of...
  • Bartelt, R., The Essentials of Industrial Metrology, Part 1: Form profiles with interruptions, Exactly, Mahr, 1(2002),...
  • Bartelt, R., The Essentials of Industrial Metrology, Part 2: Form profiles with interruptions, Exactly, Mahr, 2(2002),...
  • Bartelt, R., The Essentials of Industrial Metrology, The uncertainty of form measurement-Aspects to be observed,...
  • R. Furutani et al.

    High resolution probe system for CMM

    Proc. 2nd euspen Int. Conf., Torino, Italy

    (2001)
  • A. Weckenmann

    Koordinaten-Messtech-nik, Ueberblick, Entwicklung, Anwendung

    VDI Berichte

    (1981)
  • Krypton Industrial Metrology, Portable CMM Systems

  • F. Haertig et al.

    Accuracy enhancement of a co-ordinate measurement machine by flexible integration of a precision tracking interferometer

    Proc. of euspen 2002

    (2002)
  • N.N

    Styli and accessories, Renishaw

  • D.M. Anthony

    Engineering Metrology

    (1986)
  • P.A. Cauchick-Mighel et al.

    Factors which influence CMM touch-trigger probe performance

    International Journal of Machine Tools and Manufacture

    (1998)
  • N.N

    Probe has a soft touch

    Quality Magazine

    (2001)
  • J.-C. Lu et al.

    Two Dimensional Tracing and Measurement Using Touch-trigger Probe

    Annals of CIRP

    (1982)
  • Herzog, K., 1977, Mess- und Tastsysteme bei Mehrkoordinaten-Messgeraeten, Vortragsmanu-skript zur 8. Arbeitstagung des...
  • T. Roth

    Antastverfahren mit Koordinaten-messgeraeten

    Feinwerktechnik & Messtechnik

    (1983)
  • S.J. Fellenstein

    Can scanning probes and touch-trigger probes work together?, Quality In Manufacturing, January-February

  • H. Janocha

    Konzept eines neuen Messtasters fuer automatische Mehrkoordinaten-Messgeraete

    Feinwerktechnik & Messtechnik

    (1978)
  • H. Janocha

    Mikrorechner erhoeht Universalitaet und Flexibilitaet eines dynamischen Koordinaten-Messtasters

    Messen+Pruefen /Automatik

    (1984)
  • Janocha, J., 1973, Entwurf eines Messtasters zur mehrdimensionalen dynamischen Abtastung raeumlicher Konturen, PhD...
  • J.D. Destefani

    CMM's Make Contact

    Manufacturing Engineering

    (2001)
  • A. Weckenmann et al.

    Koordinaten-messgeraete

    VDI-2

    (1983)
  • A. Weckenmann et al.

    Koordinatenmessgeraete

  • M. Bambach et al.

    Bestimmung der Antastunsicherheit elektronischer 3-D-Tast-systeme

    VDI-Berichte

    (1980)
  • F.M.M. Chan et al.

    Some performance characteristics of a multi-axis touch-trigger probe

    Measurement science and technology

    (1997)
  • Flack, D., 2001, CMM Probing, Measurement Good Practice Guide No. 43,...
  • J.R.R. Mayer et al.

    3D characterisation, modelling and compensation of the pre-travel of a kinematic touch-trigger probe

    Measurement

    (1996)
  • A. Wozniak et al.

    Metrological feasibilities of CMM touch-trigger probes. Part I: 3D theoretical model of probe pretravel

    Measurement

    (2002)
  • Cited by (318)

    • Dynamics model of scanning probe on GMC

      2022, Measurement: Journal of the International Measurement Confederation
    View all citing articles on Scopus

    NOTE: References to Internet URL addresses include a time stamp that indicates when the cited information was accessed. The existence and/or content of www sites is subject to change without notice.

    View full text