Structural characterization and EXAFS wavelet analysis of Yb doped ZnO by wet chemistry route
Introduction
ZnO is an interesting material due to its structural, electrical and optical properties. The structural properties are related to its wurtzite structure (space group P63mc), that allows obtaining varied morphologies of the oxide: colloidal nanoparticles [1], nanostructured colloids [2], nanorods [3], [4], [5], [6], nanowires [7], [8], [9], and tetrapods [10], thin films [11], among another complex nanostructures [12], [13], [14]. To obtain these morphologies several methods such as: thermal evaporation [7], [10], [13], laser ablation [4], hydrothermal synthesis [3], [6], [8], [14], forced hydrolysis[2], [12], precipitation [1] and electro-deposition [5], [15], are implemented.
The nonlinear current–voltage (I–V) properties of ZnO, are known since the ’50 [16], however it was not until the ’70s, when Matsuoka [17] rediscovered its electrical properties settling the basis for the implementation of ZnO in varistors. In spite of the origin of the nonlinear I–V behavior that is not completely understood, it was reported that ion segregation at the interfaces has a great influence in this phenomena. Just as an example, Sato et al. showed that in the ZnO:Pr system, the Pr atoms are located at the grain boundaries [18], and Jiang et al. demonstrated that for ZnO:Yb, the Yb presence induces oxygen rich zones by means of a detailed HRTEM–EELS analysis [19].
The good optical properties of ZnO have intensified the interest in this material for applications in hybrid light-emitting diodes [20], [21], [22], and its doping with lanthanides (Ln) as activators [23], [24], [25] has a potential use in flat displays. One drawback for these last applications is that the energy transfer from the host to the Ln ion is not efficient enough, making them not suitable to be used in devices [26]. The origin of this observation may be attributed to the fact that Ln ions occupy an interstitial site in the lattice [27].
To have a deeper knowledge on the electrical and optical properties of Ln doped ZnO, it is important to determine whether the Ln ions are located into the structural framework, or whether they are segregated in the grain boundaries [28]. In this work, we present a soft chemistry route for the synthesis of ZnO:Yb and its characterization based on Transmission Electron Microscopy (TEM), X-ray Diffraction (XRD), Rietveld refinement of XRD data and X-ray Absorption Fine Structure Spectroscopy (XAFS).
The X-ray diffraction technique (XRD) provides information of the host matrix. Differences in the cell parameters of pure and doped samples, treated at different temperatures, supplied experimental evidence of the incorporation of Yb atoms in the ZnO lattice. On the other hand, the X-ray absorption measurements (X-ray Absorption Near Edge Spectroscopy and XANES, and Extended X-ray Absorption Fine Structure, EXAFS) are specific to the Yb atoms environment providing structural information of the changes taking place in samples with different thermal treatment.
Taking into account the EXAFS equation [29], [30]:where Si is the amplitude reduction factor for the total central atom loss, Nj and Rj are the number of neighbor atoms and the distance of each one from the central atom, |fi(k,π)| is the effective curved-wave backscattering amplitude function, is the Debye–Waller term, λj is the photoelectron mean-free path, and ∑ϕij(k) is the sum over all the phase shifts.
Based on this, the identity of the backscattering atoms can be determined by the backscattering function. Wavelet analysis allows improving the data analysis due to the possibility to observe all the EXAFS contributions simultaneously, obtaining a tridimensional representation of k (reciprocal) and R (real) space.
Several reports can be found about the fundamentals of wavelet analysis [31], [32], [33] and its implementation [30], [34], [35]. In our case, we applied the Continuous Cauchy Wavelet Analysis (CCWT) to the EXAFS spectra which allows determining the identity of the atoms in noisy signals [30], [36].
The correlation of the experimental results provided a conclusive structural evidence of the Ln incorporation in the structural framework and a range of temperature for thermal annealing to obtain ZnO:Yb without phase segregation.
Section snippets
Experimental section
Zinc acetate dihydrate (Zn(AcO)2⋅2H2O, (puriss. – Sigma–Aldrich) (ZAD), ytterbium acetate octahydrated (Yb(AcO)3⋅8H2O) (99.9% – Sigma–Aldrich), potassium hydroxide (KOH) (p.a. – Merck), absolute ethanol (EtOH) (p.a. – Merck), dimethylformamide (DMF) (p.a. – J.T. Baker) and hexane (p.a. – Riedel-de Haen) were used without further purification. Hydration water from lanthanides acetates were quantified by thermogravimetric analysis up to 1000 °C for full conversion into sesquioxides.
The synthetic
TEM analysis
The HRTEM images (Fig. 1) shows the good crystallinity of the agglomerated nanoparticles. This is corroborated by FFT (Fast Fourier Transform) that shows a sharp ring pattern. The size distribution of nanoparticles ranges within a 4–8 nm interval.
Nanoparticles agglomeration did not show any preferential orientation in spite of some specific orientations such as [0 0 1], [1 0 1] and [1 1 0] zone axis that can be observed in the nanoparticles at the edge of the colloidal particles.
XRD analysis
The ZnO:Yb-070 sample
Conclusions
ZnO:Yb with good crystallinity and free of crystalline impurities was synthesized by a soft chemistry route and structurally characterized by X-ray techniques. The combined utilization of Rietveld refinement, XAS characterization and data analysis techniques proves the insertion of lanthanide ions in the Oh sites of the ZnO structure without phase segregation. Differently from our previous paper using XRD [43], where only the interstitial insertion could be postulated. The CCWT proved that the
Acknowledgments
This work was financially supported by the YPF foundation (José A. Estenssoro PhD Grant), CONICET (Type 2 PhD Grant) and CITEDEF. The authors are grateful for being given access to the facilities of the XAFS (D04B – XAFS1 #6673, #7732 and #8239) beamlines at the LNLS. Also to Dr. Gustavo Azevedo from LNLS for his invaluable help in the XAFS measurements, Raul Tarulla from CITEDEF for ICP-EOS analysis and Matias Jobbágy from INQUIMAE-FCEN-UBA for the generous help in the thermal analysis of
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