Nondestructive evaluation of multilayered paint films in ambient atmosphere using terahertz reflection spectroscopy
Introduction
Pulsed terahertz (THz) broadband systems have become remarkably important tools for the investigation of numerous materials over frequencies from a few hundred GHz to several THz. Significant developments in THz science [1], [2], [3] have enhanced the performance of material characterization and triggered extensive applications in security [4], medicine [5], semiconductors [6], quality control [7], [8], etc. In particular, an area that would considerably benefit from these advancements is nondestructive evaluation of various materials in industrial applications [9], [10], [11], [12]. However, the inspection results are generally affected by various artifacts present in the THz measurements, such as electronic noise, signal fluctuation from atmospheric water vapor absorption [13], and echo signals arising from internal reflections from the sample or system components [14]. These complications are frequently risen in analyses of layered materials in ambient atmosphere, hence, causing hardship in accurate characterization.
In the last decade, several authors proposed insightful approaches to overcome these obstacles. The temporal peak analysis [8] and the inverse electromagnetic problem [15], [16], [17] are most commonly used, but they require several reflections of the THz pulse and are typically applicable only to homogeneous, low absorption, and single-layered materials. THz signal manipulation techniques, such as the removal of multiple echo signals [18], [19], [20] and signal reconstruction from atmospheric attenuation [21], [22] are greatly competent in gaining fluctuation-free THz signals but face complex signal processing procedures and inevitably possess the possibility of data alteration. The recent dispersion model-based methods [23], [24] provide extremely accurate material analyses, but sometimes require prior knowledge about the sample or undergo necessary parameterization schemes. Therefore, these methods are mostly valid only in limited situations and still remains relatively unused in real-world applications.
In our earlier report [25], we have introduced a simple and intuitive model-based approach that can be universally applied for the decomposition of THz transmission signals. The method showed distinctive advantages in that it did not require any prior information of the sample under investigation or incorporate removal/reconstruction techniques of any kind. Here, we extend the findings from our previous report and present qualitative monitoring and evaluation of materials with layered structures. Particularly, we suggest a realistically employable method of analyzing angled reflection measurements, the most feasible way of nondestructively testing various samples. The article encompasses the investigation of multilayered paint films, verification of the THz signal decomposition algorithm in uncontrolled temperature and humidity settings, and THz reflection time-domain spectroscopy. A brief description and background of the proposed method is given, followed by experimental results and comprehensive performance assessment.
Section snippets
Terahertz reflection time-domain spectrometer
The THz spectrometer used in this experiment is similar to the setup of Ref. [26] and is consisted of a femtosecond laser, photoconductive THz emitter and an electro-optic detector (Fig. 1). Pumped by a continuous wave 532-nm diode-pumped solid state laser, the mode-locked Ti:Sapphire femtosecond laser (pulse duration=25 fs, center wavelength=800 nm, average power=250 mW) emits a femtosecond pulse, divided into a pump and probe beam by a beam splitter. The pump beam generates pulsed THz radiation
Assumptions and notations
Throughout this paper, the prepared samples are assumed to be homogeneous (layer-wise) and planar (at least for the region illuminated by the THz beam) to neglect scattering effects or incident angle errors. This will ensure the spatial and directional consistency of the sample characteristics. We denote the propagation, transmission, and reflection coefficients as Pa(x), Tab and Rab, respectively. Pa(x) represents the propagation of a THz wave in material a after length x. Tab and Rab
Terahertz signal decomposition
Each THz sample signal obtained from reflection measurements of the multilayered films showed several peaks due to multiple reflections caused from the paint interfaces. The black graphs in Fig. 3 show the recorded THz sample signals of the EH2350-ENA300, Interthane 989-ENA300, and BEA777-ENA300 paint films. Three main THz pulse peaks are visible due to the three interfaces in each sample. We then obtained sets of clearly separated THz signals, where successive decomposition of the constituting
Conclusion
In this work, we have presented experimental results showing highly accurate nondestructive evaluation of multilayered samples using THz reflection spectroscopy. Experiments were carried out in ambient atmosphere. Superposed, complex THz sample signals resulting from Fabry–Pérot reflections were effectively decomposed using an accurate and simple extraction algorithm. We could confirm the validity of the layer-by-layer spectral evaluation, hence, present qualitative monitoring of the
Acknowledgments
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korean government (MSIP) (No. NRF-2010-0017795). The authors wish to acknowledge Dr. Won-Jun Yun at Hyundai Heavy Industries Co., Ltd. for preparing the samples investigated in this experiment.
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