Belle II SVD ladder assembly procedure and electrical qualification
Introduction
The Belle II experiment will operate at an instantaneous luminosity of , and will replace its predecessor (Belle) as the next-generation luminosity frontier experiment. The Belle II detector [1] has two inner layers of PXD [2] followed by four outer layers of SVD to perform a precise vertex measurement in this high luminosity environment. Each SVD layer is made up of overlapping ladder modules in a central cylindrical arrangement and a slanted conical region at one end.
The basic detecting elements are 6 in. double-sided silicon microstrip (DSSD) sensors provided by HPK and Micron. The cylindrical central region of the SVD consists of rectangular sensors and the slanted region will feature trapezoidal sensors. The origami flexible electrical boards are attached to the DSSDs in order to minimize the distance to the APV25 readout ASIC chips [3], thus minimizing capacitive noise. The total sensor area is with an overlap of 8–10% and a polar angle coverage between 17° and 150° with respect to the detector axis (the direction of the beam is taken as the positive z direction).
Section snippets
Assembly procedure and electrical test
The assembly procedure is carried out in clean rooms with class . Dedicated jigs are designed and fabricated for the purpose of precise alignment of different components of the ladder module during the assembly procedure, which have a machining precision of .
Pitch adaptors PA1 and PA2 are first glued onto the P-side of the rectangular sensors with proper alignment and the electrical pads of the P-side sensor readouts are wire bonded with the corresponding pads of PA1 and PA2. All
Conclusions
The assembly procedure and electrical testing of the Belle II SVD ladders have been developed in conjunction with the optimization of wire-bonding and gluing operations required for the assembly. Several prototype ladders have been successfully assembled and tested for their geometrical tolerance and electrical capability.
References (3)
Nuclear Instruments and Methods A
(2001)