Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume 502, 1 September 2021, Pages 164-175
Insights into secondary ion formation during dynamic SIMS analysis: Evidence from sputtering of laboratory synthesized uranium compounds with a high-energy O− primary beam on a NanoSIMS 50L
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Keywords
Secondary Ion Mass Spectrometry
Uranium
Oxygen Ion Beam
Ion Probe
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© 2021 The Author(s). Published by Elsevier B.V.