Abstract
The genetic constitution of resistance to Fusarium head blight (FHB, scab) caused by Fusarium graminearum in the Chinese wheat cultivar Sumai 3 and the Japanese cultivar Saikai 165 was investigated using doubled haploid lines (DHLs) and recombinant inbred lines (RILs). Frequency distributions of DHLs derived from two F1 crosses, Sumai 3 (very resistant to resistant; VR-R) / Gamenya (very susceptible; VS) and Sumai 3 / Emblem (VS), fitted well to 1: 2: 1 (resistant: moderately resistant: susceptible) ratios for reaction to FHB in the field. It is suggested that the resistance of Sumai 3 is controlled by two major genes with additive effects. One of the resistance genes may be linked in repulsion to the dominant suppressor B1 for awnedness with recombination values 15.1 ± 3.3% in Sumai 3 /Gamenya and 21.4 ± 4.3% in Sumai 3 / Emblem. Saikai 165 is a Japanese resistant line derived from an F1 Sumai 3 / Asakaze-komugi (moderately resistant; MR). The data for RILs derived from the cross Emblem / Saikai 165, indicates that three resistance genes control the resistance of Saikai 165.
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Ban, T., Suenaga, K. Genetic analysis of resistance to Fusarium head blight caused by Fusarium graminearum in Chinese wheat cultivar Sumai 3 and the Japanese cultivar Saikai 165. Euphytica 113, 87–99 (2000). https://doi.org/10.1023/A:1003951509797
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DOI: https://doi.org/10.1023/A:1003951509797