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ICTS Measurements of Single Grain Boundaries in ZnO:rare-earth Varistor

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Abstract

Properties of single grain boundaries in ZnO:rare-earth varistors were examined by the isothermal capacitance transient spectroscopy (ICTS) method. Micro-electrodes prepared by photolithography were used for measuring the behavior of single junctions in ZnO varistors. From current-voltage measurements, it was found that the non-linear exponents of single junctions varied from 3 to 14. Interface state levels existed at 0.9 eV below the conduction band edge for every junction. On the other hand, the interface state density varied from junction to junction and the non-linearity was shown to increase with increasing interface state density.

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Reference

  1. M. Matuoka, Jpn. J. Appl. Phys., 10, 736 (1971).

    Google Scholar 

  2. K. Mukae, K. Tsuda, and I. Nagasawa, Jpn. J. Appl. Phys., 16, 1361 (1977).

    Google Scholar 

  3. G. E. Pike, S. R. Kurtz, and P. L. Gourley, J. Appl. Phys., 57, 5512 (1985).

    Google Scholar 

  4. G. D. Mahan, L. M. Levinson, and H. R. Philipp, J. Appl. Phys., 50, 2799 (1979).

    Google Scholar 

  5. K. Mukae and K. Tsuda, J. Ceram. Soc. Japan, 100, 1048 (1992).

    Google Scholar 

  6. N. Shohata, T. Matsumura, and T. Ohno, Jpn. J. Appl. Phys., 19, 1793 (1980).

    Google Scholar 

  7. A. Nitayama, H. Sakaki, and T. Ikoma, Jpn. J. Appl. Phys., 19, L743 (1980).

    Google Scholar 

  8. K. Tsuda and K. Mukae, High Tech Ceramics, edited by P. Vincenzini (Elsevier, Amsterdam, 1987), pp. 1781.

    Google Scholar 

  9. R. A. Winston and J. F. Cordaro, J. Appl. Phys., 68, 6495 (1990).

    Google Scholar 

  10. D. V. Lang, J. Appl. Phys., 45, 3023 (1974).

    Google Scholar 

  11. G. D. Mahan, L. M. Levinson, and H. R. Philipp, J. Appl. Phys., 50, 2799 (1979).

    Google Scholar 

  12. M. Tao, B. Al, O. Dorlanne, and A. Loubiere, J. Appl. Phys., 61, 1562 (1987).

    Google Scholar 

  13. J. T. C. Van Kemenade and R. K. Eijnthoven, J. Appl. Phys., 50, 938 (1979).

    Google Scholar 

  14. E. Olsson and G. L. Dunlop, J. Appl. Phys., 66, 3666 (1989).

    Google Scholar 

  15. H. Wang, V. Li, and F. Cordaro, Jpn. J. Appl. Phys., 34, 1765 (1995).

    Google Scholar 

  16. H. Okushi and Y. Tokumaru, Jpn. J. Appl. Phys., 19, L335 (1980).

    Google Scholar 

  17. T. Maeda, S. Meguro, and M. Takata, Jpn. J. Appl. Phys., 28, L714 (1989).

    Google Scholar 

  18. K. Tsuda and K. Mukae, J. Ceram. Soc. Japan, 100, 1239 (1992).

    Google Scholar 

  19. K. Mukae, K. Tsuda, and I. Nagasawa, J. Appl. Phys., 50, 4475 (1979).

    Google Scholar 

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Authors and Affiliations

  1. Fuji Electric Corporate Research and Development Ltd., 2-2-1 Nagasaka, Yokosuka-shi, Kanagawa, 240-0194, Japan

    Akinori Tanaka & Kazuo Mukae

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  1. Akinori Tanaka
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  2. Kazuo Mukae
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Tanaka, A., Mukae, K. ICTS Measurements of Single Grain Boundaries in ZnO:rare-earth Varistor. Journal of Electroceramics 4 (Suppl 1), 55–59 (1999). https://doi.org/10.1023/A:1009973704222

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