Abstract
We report stimulated emission depletion (STED) fluorescence microscopy with continuous wave (CW) laser beams. Lateral fluorescence confinement from the scanning focal spot delivered a resolution of 29–60 nm in the focal plane, corresponding to a 5–8-fold improvement over the diffraction barrier. Axial spot confinement increased the axial resolution by 3.5-fold. We observed three-dimensional (3D) subdiffraction resolution in 3D image stacks. Viable for fluorophores with low triplet yield, the use of CW light sources greatly simplifies the implementation of this concept of far-field fluorescence nanoscopy.
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Acknowledgements
We thank B. Hein for sharing the setup, T. Lang (Department of Neurobiology) for providing the PC12 membrane sheets, A. Schönle, V. Westphal and J. Keller for help with the measurement and analysis software, and B. Rankin for critical reading of the manuscript.
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Willig, K., Harke, B., Medda, R. et al. STED microscopy with continuous wave beams. Nat Methods 4, 915–918 (2007). https://doi.org/10.1038/nmeth1108
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DOI: https://doi.org/10.1038/nmeth1108