Issue 2, 2021
From the journal:

Chemical Communications

Electrochemically induced iodine migration in mixed halide perovskites: suppression through chloride insertion†

Junsang Cho,a   Jeffrey T. DuBose, ORCID logo ab   Preethi S. Mathewab  and  Prashant V. Kamat ORCID logo *abc  

* Corresponding authors

a Radiation Laboratory, University of Notre Dame, Notre Dame, Indiana 46556, USA
E-mail: pkamat@nd.edu

b Department of Chemistry and Biochemistry, University of Notre Dame, Notre Dame, Indiana 46556, USA

c Department of Chemical and Biomolecular Engineering, University of Notre Dame, Notre Dame, Indiana 46556, USA

Abstract

The role of chloride in improving the stability of mixed halide perovskites (MAPbClxBr0.5(1−x)I0.5(1−x))3 is probed using spectroelectrochemistry. The injection of holes into mixed halide perovskite films through applied anodic bias results in the selective migration of iodine with ultimate expulsion into the electrolyte. Increasing the Cl content (x = 0 to 0.1) in the mixed halide perovskite suppresses the iodine mobility and thus decreases the rate of its expulsion into the solution. Implications of iodine mobility induced by hole accumulation and its impact on overall stability is discussed.

Graphical abstract: Electrochemically induced iodine migration in mixed halide perovskites: suppression through chloride insertion

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Article information

DOI
https://doi.org/10.1039/D0CC06217K
Article type
Communication
Submitted
15 Sep 2020
Accepted
19 Nov 2020
First published
23 Nov 2020

Chem. Commun., 2021,57, 235-238

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Electrochemically induced iodine migration in mixed halide perovskites: suppression through chloride insertion

J. Cho, J. T. DuBose, P. S. Mathew and P. V. Kamat, Chem. Commun., 2021, 57, 235 DOI: 10.1039/D0CC06217K

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