* Corresponding authors

^a South Ural State University, Lenin av., 76, Chelyabinsk, Russia

^b South Ural State Humanitarian Pedagogical University, Lenin av., 69, Chelyabinsk, Russia

^c Institute for Theoretical and Applied Electromagnetics, Russian Academy of Sciences, Izhorskaya str., 13, Moscow, Russia

^d Moscow Institute of Physics and Technology (State University), Institutskiy l., 9, Dolgoprudny, Russia

^e National University of Science and Technology MISiS, Leninskiy av., 4, Moscow, Russia

^f Scientific Practical Materials Research Centre, National Academy of Sciences of Belarus, Minsk 220072, Belarus
E-mail: truhanov@ifttp.bas-net.by

^g Department of Physics, Federal University of Ceara, Fortaleza, Ceara 60-455-970, Brazil

^h Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi'an 710049, China

ⁱ Department of Physics, Electronics and Space Science, Gujarat University, Gujarat, Ahmedabad 380009, India

^j School of Electronics and Electrical Engineering, Lovely Professional University, Phagwara, Punjab 144411, India