V K-edge EXAFS studies of V2O5/SiO2 catalysts prepared by a chemical vapour deposition (CVD) method demonstrate the formation of V2O5 thin films, while the V2O5 of V2O5/SiO2 prepared by an impregnation method is mainly in the form of microcrystallites.
K. Inumaru, T. Okuhara, M. Misono, N. Matsubayashi, H. Shimada and A. Nishijima, J. Chem. Soc., Faraday Trans., 1991, 87, 1807 DOI: 10.1039/FT9918701807
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