Issue 0, 1969

Electron diffraction determination of the molecular structure of disilazane

Abstract

The structure of disilazane, (SiH3)2NH, has been determined by the sector microphotometer method of electron diffraction. The Si–N bond length is 1·725 ± 0·003 Å, and the Si–N–Si angle is 127·7°± 0·1°; these results are discussed in terms of (pd)π-bonding. The Si–H bond length is found to be 1·484 ± 0·006 Å, and the H–Si–H angle to be 108·0°± 1·0°. The conformation of the SiH3 groups and the possibility of a distortion of the N–H bond from the heavy-atom plane have also been studied.

Article information

Article type
Paper

J. Chem. Soc. A, 1969, 1224-1227

Electron diffraction determination of the molecular structure of disilazane

D. W. H. Rankin, A. G. Robiette, G. M. Sheldrick, W. S. Sheldrick, B. J. Aylett, I. A. Ellis and J. J. Monaghan, J. Chem. Soc. A, 1969, 1224 DOI: 10.1039/J19690001224

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