Volume 65, 1969

Electron diffraction study of phenyl silyl ether

Abstract

The molecular structure of phenyl silyl ether C6H5OSiH3 has been studied by the sector-microphotometer method of electron diffraction. The Si—O bond length is 1.648 ± 0.007 Å, the C—O bond length is 1.357 ± 0.009 Å, the Si—O—C angle is 121 ± 1° and the dihedral angle between the Si—O—C plane and the aromatic ring is 68 ± 3°. These results are discussed and compared with those for similar molecules.

Article information

Article type
Paper

Trans. Faraday Soc., 1969,65, 2621-2627

Electron diffraction study of phenyl silyl ether

C. Glidewell, D. W. H. Rankin, A. G. Robiette, G. M. Sheldrick, B. Beagley and J. M. Freeman, Trans. Faraday Soc., 1969, 65, 2621 DOI: 10.1039/TF9696502621

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