Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques

Publication
Seventh International Conference on Dielectric Materials, Measurements and Applications
Published
1996
Authors
J. Krupka
DOI
https://doi.org/10.1049/cp:19960982
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ieee.org
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https://doi.org/10.1049/cp:19960982
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