The short-circuit photocurrent was measured in ferroelectric capacitors of polycrystalline and epitaxial quality. The interest was to study the possible relation between photocurrent and back-switching phenomena due to ferroelectric polarization imprint, as suggested by Pintilie et al [J. Appl. Phys. 101, 064109 (2007)]. An interesting relation between the shape of the ferroelectric hysteresis loop and the shape of the photocurrent spectral distribution was found. In polycrystalline samples, the shape of spectral distribution and the sign of photocurrent are changing in time, although the hysteresis is almost symmetrical. However, the hysteresis is not rectangular as in the case of epitaxial films. This behavior suggests a subtle relation between polarization back-switching and photocurrent. In epitaxial samples a peculiar dependence between photocurrent and polarization imprint was found. All these are explained assuming the presence of an internal field, possibly generated by charged defects, which can change its direction and magnitude under illumination, with consequence on the orientation and magnitude of the ferroelectric polarization, and on the sign/shape of the short-circuit photocurrent spectral distribution.
Skip Nav Destination
Article navigation
1 June 2010
Research Article|
June 10 2010
About the complex relation between short-circuit photocurrent, imprint and polarization in ferroelectric thin films
L. Pintilie;
L. Pintilie
1
National Institute of Materials Physics
, P.O. Box MG-7, Bucharest-Magurele 077125, Romania
Search for other works by this author on:
V. Stancu;
V. Stancu
1
National Institute of Materials Physics
, P.O. Box MG-7, Bucharest-Magurele 077125, Romania
Search for other works by this author on:
E. Vasile;
E. Vasile
2
METAV-C.D.S.A.
, Rosetti Street No. 21, Bucharest 020011, Romania
Search for other works by this author on:
I. Pintilie
I. Pintilie
a)
1
National Institute of Materials Physics
, P.O. Box MG-7, Bucharest-Magurele 077125, Romania
Search for other works by this author on:
J. Appl. Phys. 107, 114111 (2010)
Article history
Received:
February 11 2010
Accepted:
May 08 2010
Citation
L. Pintilie, V. Stancu, E. Vasile, I. Pintilie; About the complex relation between short-circuit photocurrent, imprint and polarization in ferroelectric thin films. J. Appl. Phys. 1 June 2010; 107 (11): 114111. https://doi.org/10.1063/1.3445877
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00
Citing articles via
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
GaN-based power devices: Physics, reliability, and perspectives
Matteo Meneghini, Carlo De Santi, et al.