Overview of the electron beam ion trap program at NIST

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Published under licence by IOP Publishing Ltd
, , Citation J D Gillaspy et al 1995 Phys. Scr. 1995 392 DOI 10.1088/0031-8949/1995/T59/053

1402-4896/1995/T59/392

Abstract

This paper surveys the ongoing physics experiments at the Electron Beam Ion Trap (EBIT) facility at NIST, with particular attention paid to the underlying physical principles involved. In addition, some new data on the performance of our EBIT are presented, including results related to the determination of the trap width, ion temperature, and number of highly charged ions in the trap.

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10.1088/0031-8949/1995/T59/053