Abstract
Amorphous alloys of the type Ti1-xNix were prepared by means of melt spinning in the concentration range 0.25<or=x<or=0.64. The crystallisation behaviour was studied by means of differential scanning calorimetry and X-ray diffraction. The heat of crystallisation and the activation energy for crystallisation were determined for several alloys. Electrical transport properties were studied in the temperature range 4.2-300K. The concentration dependence of the resistivity at 4.2K has a maximum near x=0.45. The temperature coefficient of the resistivity exhibits a minimum at the same concentration. From these results it would appear that in the middle concentration range in Ti1-xNix the Nagel and Tauc (1975) stability criterion (Qp=2kF) is satisfied. It is shown that this criterion is not suited for describing the thermal stability of amorphous alloys.