Optical heterodyne measurement of the wavelength dependence of quarter-wave plates' retardation

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, , Citation S De Nicola et al 1995 Pure Appl. Opt. 4 119 DOI 10.1088/0963-9659/4/3/001

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1 Istituto di Cibernetica, CNR, Arco Felice, Italy

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0963-9659/4/3/119

Abstract

An optical heterodyne polarization interferometer is described that can be efficiently used for the precision measurement of the phase shift induced by polarizing optical devices. This technique is used to measure the change with wavelength of a quarter-wave plate's retardation.

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