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The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips

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Published 22 December 2010 Published under licence by IOP Publishing Ltd
, , Focus on Advances in Surface and Interface Science 2010 Citation Nikolaj Moll et al 2010 New J. Phys. 12 125020 DOI 10.1088/1367-2630/12/12/125020

1367-2630/12/12/125020

Abstract

By functionalizing the tip of an atomic force microscope (AFM) with a molecule or an atom that significantly contributes to the tip–sample interaction, the resolution can be dramatically enhanced. The interaction and therefore the resolution crucially depend on the chemical nature of the tip termination. Employing a tip functionalized with a CO molecule, atomic resolution of a pentacene molecule was recently demonstrated. In this work, the interaction between the CO tip and the pentacene imaged are studied with first principles calculations. The calculated frequency shifts compare very well with the experiment. The different energy contributions are analyzed and the Pauli energy is computed. We demonstrate that the source of the high resolution is Pauli repulsion, whereas van der Waals and electrostatic interactions only add a diffuse attractive background.

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