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V Delaubert1, D A Shaddock1, P K Lam1, B C Buchler1, H-A Bachor1 and D E McClelland1
Published 23 May 2002 •
Published under licence by IOP Publishing Ltd
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Citation V Delaubert et al 2002 J. Opt. A: Pure Appl. Opt. 4 393
DOI 10.1088/1464-4258/4/4/305
357 Total downloads
We propose optical techniques for the generation of a TEM00 Gaussian beam which has a π phase flip in the electric field amplitudes between the two halves of the beam profile. The methods make use of a special waveplate and a masked Sagnac interferometer. The produced phase-flipped mode is the ideal light mode for optical measurements requiring high precision in one spatial dimension. Two examples of such applications are discussed.