Abstract
Digital X-ray detectors are widely used in dental radiography. The scope of this work is the examination of the spatial frequency component of a dedicated dental CMOS detector. A commercially available SCHICK CDR CMOS detector was irradiated at a Del Medical Eureka X-ray system at 60kVp and 70kVp. The irradiation setup included images of an edge, for Modulation Transfer Function (MTF) calculation. The air-KERMA was measured with an RTI PIRANHA X-ray multimeter. The images were evaluated in 'for presentation' format with the use of ImageJ software. The linear range of the detector was found in the range 13μGy-183μGy at 60 kVp and 18μGy-180μGy at 70 kVp. By inspecting the MTF curves it was found that MTF(6lp/mm)60kVp=0.29 and MTF(6lp/mm)70kVp=0.25. The inspection of the Normalized Noise Power Spetrum (NNPS) showed similar low noise components. Our results indicate that this detector presents comparable performance at both kVp, although its X-ray response (pixel value vs air KERMA) was not equal to previously published results, for the same detector type.
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