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Radiation induced defects in Tl+-doped LiF crystals

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Published under licence by IOP Publishing Ltd
, , Citation S Polosan et al 2010 IOP Conf. Ser.: Mater. Sci. Eng. 15 012081 DOI 10.1088/1757-899X/15/1/012081

1757-899X/15/1/012081

Abstract

Tl+-doped lithium fluoride crystals exhibit very interesting properties concerning the formation of colour centres after X-rays irradiation. The presence of Tl+ ions, even in small concentrations, increases the number of traps which stabilize the H-centre aggregates. These H-centre aggregates become smaller and their number increases, inducing two sets of trapping levels. Photoluminescence measurements after subsequent thermal bleaching of the thermoluminescence peaks show a faster decreasing of the F3+ centres, in three steps, compared with the F2 ones. The F-H recombination processes may induce the excitation-emission transitions of Tl+-ions.

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10.1088/1757-899X/15/1/012081