Summary
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A Per-Test Fault Diagnosis Method Based on the X-Fault Model Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Yuta YAMATO Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA Publication IEICE TRANSACTIONS on Information and Systems Vol.E89-D No.11 pp.2756-2765 Publication Date: 2006/11/01 Online ISSN: 1745-1361 DOI: 10.1093/ietisy/e89-d.11.2756 Print ISSN: 0916-8532 Type of Manuscript: PAPER Category: Dependable Computing Keyword: fault diagnosis, per-test, X-fault model, Full Text: PDF(829.4KB)>>
Summary: This paper proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model can represent all possible faulty behaviors of a physical defect or defects in a gate and/or on its fanout branches by assigning different X symbols assigned to the fanout branches. A partial symbolic fault simulation method is proposed for the X-fault model. Then, a novel technique is proposed for extracting more diagnostic information by analyzing matching details between observed and simulated responses. Furthermore, a unique method is proposed to score the results of fault diagnosis. Experimental results on benchmark circuits demonstrate the superiority of the proposed method over conventional per-test fault diagnosis based on the stuck-at fault model. | ||||||||||
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