Phonon Broadening of Impurity Lines

E. O. Kane
Phys. Rev. 119, 40 – Published 1 July 1960
PDFExport Citation

Abstract

The theory of line broadening given by Lax is found not to apply to shallow impurities in Ge and Si. Observed broadening may be instrumental at low temperatures and may be due to lifetime broadening through phonon interaction at nitrogen temperature. Calculations suggest that p-type spin resonance in germanium and silicon may be observable.

  • Received 27 January 1960

DOI:https://doi.org/10.1103/PhysRev.119.40

©1960 American Physical Society

Authors & Affiliations

E. O. Kane

  • Hughes Products, Newport Beach, California

References (Subscription Required)

Click to Expand
Issue

Vol. 119, Iss. 1 — July 1960

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Journals Archive

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×