Drift Mobilities in Semiconductors. I. Germanium

M. B. Prince
Phys. Rev. 92, 681 – Published 1 November 1953
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Abstract

The drift mobility of holes in n-type germanium and electrons in p-type germanium has been measured as functions of impurity concentration and temperature. In single crystals of resistivity greater than 10 ohm-centimeter, the mobility at 300°K of holes is μP=1900±50 cm2/volt-sec and of electrons is μN=3900±100 cm2/volt-sec. For this high resistivity material, the temperature dependence of mobility in the same units is μP=3.5×107T1.6 and μN=9.1×108T2.3, in agreement with conductivity-mobility measurements.

  • Received 24 July 1953

DOI:https://doi.org/10.1103/PhysRev.92.681

©1953 American Physical Society

Authors & Affiliations

M. B. Prince

  • Bell Telephone Laboratories, Murray Hill, New Jersey

See Also

Drift Mobilities in Semiconductors. II. Silicon

M. B. Prince
Phys. Rev. 93, 1204 (1954)

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Vol. 92, Iss. 3 — November 1953

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