Robust Fano resonance in the photonic valley Hall states

Chang-Yin Ji, Yongyou Zhang, Bingsuo Zou, and Yugui Yao
Phys. Rev. A 103, 023512 – Published 11 February 2021

Abstract

Rapidly developing photonics brings many interesting resonant optical phenomena, in which the Fano resonance (FR) always intrigues researchers because of its applications in optical switching and sensing. However, its sensitive dependence on environmental conditions makes it hard to implement in experiments. In this work we suggest a robust FR based on the photonic valley Hall insulators, immune to the system impurities. The robust FR is achieved by coupling the valley-dependent edge states with one double-degenerate cavity. The δ-type photonic transport theory we build reveals that this FR dates from the interference of the two transmissions that are attributed to the two cavity modes. We confirm that the induced Fano line shape of the transmission spectra is robust against the bending domain walls and disorders. Our work may provoke exciting frontiers for manipulating the valley transport and pave a way for the valley photonic devices such as optical switches, low-threshold lasers, and ultrasensitive sensors.

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  • Received 17 July 2020
  • Revised 19 September 2020
  • Accepted 21 January 2021

DOI:https://doi.org/10.1103/PhysRevA.103.023512

©2021 American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & Optical

Authors & Affiliations

Chang-Yin Ji1,2, Yongyou Zhang1,*, Bingsuo Zou3, and Yugui Yao1,†

  • 1Key Lab of advanced optoelectronic quantum architecture and measurement (MOE), Beijing Key Lab of Nanophotonics & Ultrafine Optoelectronic Systems, and School of Physics, Beijing Institute of Technology, Beijing 100081, China
  • 2China Academy of Engineering physics, Mianyang, Sichuan 621900, China
  • 3Guangxi Key Laboratory of Processing for Non-ferrous Metals and Featured Materials, School of Physical science and Technology, Guangxi University, Nanning 530004, China

  • *Author to whom correspondence should be addressed: yyzhang@bit.edu.cn
  • ygyao@bit.edu.cn

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Issue

Vol. 103, Iss. 2 — February 2021

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