Electron-impact ionization of Ar2, ArKr, Kr2, KrXe, and Xe2

H. Helm, K. Stephan, and T. D. Märk
Phys. Rev. A 19, 2154 – Published 1 June 1979
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Abstract

Relative cross sections for electron-impact ionization of the rare-gas Van der Waals dimers Ar2, ArKr, Kr2, KrXe, and Xe2 have been measured with a mass spectrometer in the electron energy range from threshold to 180 eV. The following appearance potentials for direct ionization from the corresponding neutral dimers have been found: Ar2+: 15.2±0.2 eV, ArKr+: 14.0±0.2 eV, Kr2+: 13.45±0.3 eV, KrXe+: 12.2±0.2 eV, and Xe2+: 11.75±0.3 eV. These values agree with those obtained in recent photoelectron studies. The appearance potential of Ar2+ formation via associative ionization of argon atoms is found to be 14.6±0.2 eV.

  • Received 4 December 1978

DOI:https://doi.org/10.1103/PhysRevA.19.2154

©1979 American Physical Society

Authors & Affiliations

H. Helm*

  • Institut für Theoretische Physik, Universität Innsbruck, Austria

K. Stephan and T. D. Märk

  • Institut für Experimentalphysik, Universität Innsbruck, Austria

  • *Current address: Molecular Physics Center, SRI International, Menlo Park, Calif. 94025.

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Issue

Vol. 19, Iss. 6 — June 1979

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