Abstract
Measurements of the target-thickness dependences of the target x-ray production yields are reported for 1.7-MeV/amu () ions incident upon thin solid targets of elements from Ti to Co. Target x-ray production cross sections were extracted in the limit of vanishing target thickness. Comparisons of the data to theoretical estimates based upon combinations of direct ionization and electron-transfer processes are presented. Projectile -vacancy production and quenching cross sections were obtained from the three-component model for the target x-ray data as a function of foil thickness. Comparisons of the projectile parameters to theoretical estimates based upon electron transfer, direct ionization, and excitation processes are presented.
- Received 28 August 1978
DOI:https://doi.org/10.1103/PhysRevA.19.2167
©1979 American Physical Society