Electric field dependence of trapping in one dimension

B. Movaghar, B. Pohlmann, and D. Würtz
Phys. Rev. A 29, 1568 – Published 1 March 1984
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Abstract

We have derived an exact analytic solution for the electric field and time dependence of the survival fraction in the one-dimensional trapping problem. The intermediate- and long-time behavior is discussed below and above a threshold region of the electric field strength. The mean decay rate is given as a function of trap concentration and electric field strength.

  • Received 18 February 1983

DOI:https://doi.org/10.1103/PhysRevA.29.1568

©1984 American Physical Society

Authors & Affiliations

B. Movaghar

  • General Electric Company Research Laboratories, Hirst Research Centre, Wembley, Middlesex HA9 7PP, United Kingdom

B. Pohlmann

  • Department of Physics, University of Marburg, D-3550 Marburg, Federal Republic of Germany

D. Würtz

  • Institute for Theoretical Physics, University of Heidelberg, D-6900 Heidelberg, Federal Republic of Germany

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Vol. 29, Iss. 3 — March 1984

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