Optical Measurements of Strong Microwave Fields with Rydberg Atoms in a Vapor Cell

D. A. Anderson, S. A. Miller, G. Raithel, J. A. Gordon, M. L. Butler, and C. L. Holloway
Phys. Rev. Applied 5, 034003 – Published 4 March 2016

Abstract

We present a spectral analysis of Rydberg atoms in strong microwave fields using electromagnetically induced transparency (EIT) as an all-optical readout. The measured spectroscopic response enables optical, atom-based electric-field measurements of high-power microwaves. In our experiments, microwaves are irradiated into a room-temperature rubidium vapor cell. The microwaves are tuned near the two-photon 65D66D Rydberg transition and reach an electric-field strength of 230V/m, about 20% of the microwave-ionization threshold of these atoms. A Floquet treatment is used to model the Rydberg-level energies and their excitation rates. We arrive at an empirical model for the field-strength distribution inside the spectroscopic cell that yields excellent overall agreement between the measured and calculated Rydberg EIT-Floquet spectra. Using spectral features in the Floquet maps, we achieve an absolute strong-field measurement precision of 6%.

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  • Received 15 October 2015

DOI:https://doi.org/10.1103/PhysRevApplied.5.034003

© 2016 American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & Optical

Authors & Affiliations

D. A. Anderson*, S. A. Miller, and G. Raithel

  • Department of Physics, University of Michigan, Ann Arbor, Michigan 48109, USA

J. A. Gordon, M. L. Butler, and C. L. Holloway

  • National Institute for Standards and Technology, U.S. Department of Commerce, Boulder, Colorado 80305, USA

  • *Present address: Rydberg Technologies, LLC, Ann Arbor, Michigan 48104, USA.

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Vol. 5, Iss. 3 — March 2016

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