Band-gap shrinkage of semiconductors

D. Auvergne, J. Camassel, and H. Mathieu
Phys. Rev. B 11, 2251 – Published 15 March 1975
PDFExport Citation

Abstract

Direct experimental evidence of band-gap shrinkage due to the presence of impurities in semiconductors is given. Experimental results are obtained using a piezomodulation-spectroscopy technique over the (4-300)°K temperature range. They are interpreted in the linear-screened-potential and effective-mass approximations. Coupling spectroscopic and helium-temperature magnetotransport measurements allowed us to obtain in this model a good description of the transition edges over the entire temperaure range. We studied different GaSb samples with impurity concentration allowing us to observe band-gap shrinkage with one and two types of carriers. This is easily obtained in the GaSb case whose band structure presents Γ and L minima located very near in energy. On heavily doped samples, the low-temperature values of the band-gap shrinkage are used to obtain further informations concerning subsidiary minima. On lightly doped semiconductors, non-k -conserving transitions initiating on the residual acceptor level are clearly shown.

  • Received 12 September 1974

DOI:https://doi.org/10.1103/PhysRevB.11.2251

©1975 American Physical Society

Authors & Affiliations

D. Auvergne, J. Camassel, and H. Mathieu

  • Centre d'Etudes d'Electronique des Solides, associé au Centre National de la Recherche Scientifique, Université des Sciences et Techniques du Languedoc, Place E. Bataillon, 34060 Montpellier-Cedex, France

References (Subscription Required)

Click to Expand
Issue

Vol. 11, Iss. 6 — 15 March 1975

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×