Neutral impurity scattering in semiconductors

T. C. McGill and R. Baron
Phys. Rev. B 11, 5208 – Published 15 June 1975
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Abstract

The drift mobility and ratio of Hall to drift mobility are computed for the scattering of carriers by a hydrogenic neutral impurity. The scattering is treated using the almost exact values of the phase shifts for scattering of electrons by neutral hydrogen scaled for the effective mass and dielectric constant of the semiconductor.

  • Received 2 December 1974

DOI:https://doi.org/10.1103/PhysRevB.11.5208

©1975 American Physical Society

Authors & Affiliations

T. C. McGill*,†

  • California Institute of Technology, Pasadena, California 91125
  • Hughes Research Laboratories, Malibu, California 90265

R. Baron

  • Hughes Research Laboratories, Malibu, California 90265

  • *Work supported in part by Air Force Office of Scientific Research under Grant No. 73-2490.
  • Alfred P. Sloan Foundation Fellow.

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Vol. 11, Iss. 12 — 15 June 1975

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