Free-exciton energy spectrum in GaAs

S. B. Nam, D. C. Reynolds, C. W. Litton, R. J. Almassy, T. C. Collins, and C. M. Wolfe
Phys. Rev. B 13, 761 – Published 15 January 1976
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Abstract

The exciton energy spectrum in GaAs has been studied by photoluminescence and reflection. The photoluminescence was excited using a krypton laser (6471 Å). We observed for the first time the spectra for the excited states of the free exciton in GaAs and also the spectra for the ground states in zero field and in the field range from 12 to 40 kG. The value for the exciton binding energy was determined to be (4.20 ± 0.3) × 103 eV from which the band-gap energy of 1.5195 ± 0.0005 eV has been deduced. The values for the Zeeman splitting factors for electron (g factor) and hole (κ parameter) were deduced from these measurements to be gc=0.50±0.05 and κ=1.0±0.2, respectively. A phenomenological description for the free-exciton energy spectrum in the intermediate-field regime is used to explain the experimental measurements.

  • Received 18 August 1975

DOI:https://doi.org/10.1103/PhysRevB.13.761

©1976 American Physical Society

Authors & Affiliations

S. B. Nam*, D. C. Reynolds, C. W. Litton, R. J. Almassy, and T. C. Collins

  • Air Force Avionics Laboratory, Wright-Patterson Air Force Base, Ohio 45433

C. M. Wolfe

  • Department of Electrical Engineering and Laboratory for Applied Electronic Sciences, Washington University, St. Louis, Missouri 63130

  • *Senior Research Fellow of National Academy of Science (U. S. A.)—National Research Council.

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Vol. 13, Iss. 2 — 15 January 1976

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