Abstract
Single-particle (Giaever) tunneling has been performed on Al thin films with goodquality junctions formed by oxidized amorphous-silicon barriers. The tunneling measurement is used as a diagnostic probe for assessing the material properties of Al, including changes in the progressive film growth. The electron-phonon spectral function and related physical parameters are generated by the proximity-effect inversion analysis of the tunneling density of states. We find that Al is a strong-coupled superconductor with only when the composition approaches the phase boundary (24 at.% Al). A difference in the lowfrequency behavior of , observed between two junctions of different coupling strength, strongly suggests the importance of a mode softening mechanism, and implies that the average are rather sensitive to composition, or perhaps disorder. The lattice of Al being softer than Sn and Si contributes significantly to the large and the high of Al.
- Received 1 October 1980
DOI:https://doi.org/10.1103/PhysRevB.23.3230
©1981 American Physical Society