Recombination in a-Si: H: Spin-dependent effects

R. A. Street
Phys. Rev. B 26, 3588 – Published 1 October 1982
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Abstract

Spin-dependent recombination in a-Si: H is studied using optically detected magnetic resonance (ODMR). Measurements are reported of the dependence of ODMR on temperature, illumination intensity, luminescence energy, microwave power, and defect density. Time-resolved ODMR using both transient illumination and transient microwave pulses are shown to be particularly informative. Samples with high-defect density exhibit a quenching spin-dependent effect which is identified with nonradiative recombination between unthermalized spins. The recombination is attributed to tunneling of band-tail electrons to dangling bonds. Low-defect-density samples have an additional quenching nonradiative mechanism, tentatively identified with Auger recombination, and a radiative enhancing process which we attribute to band-tail luminescence. The results support previous luminescence studies. We discuss the effects of microwave power, spin relaxation, and exchange on the ODMR results. The spin-lattice relaxation time T1 and its temperature dependence are obtained from time-resolved ODMR and from ESR saturation measurements. Relaxation mechanisms are identified from the data.

  • Received 18 January 1982

DOI:https://doi.org/10.1103/PhysRevB.26.3588

©1982 American Physical Society

Authors & Affiliations

R. A. Street

  • Xerox Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, California 94304

Comments & Replies

Comment on "Recombination in a-Si: H: Spin-dependent effects"

S. P. Depinna
Phys. Rev. B 28, 5327 (1983)

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Vol. 26, Iss. 7 — 1 October 1982

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