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Oxidation of GaAs(110): New results and models

G. Landgren, R. Ludeke, J. F. Morar, Y. Jugnet, and F. J. Himpsel
Phys. Rev. B 30, 4839(R) – Published 15 October 1984
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Abstract

The oxidation of ultra high-vacuum-cleaved GaAs(110) surfaces has been studied with high-resolution, core-level photoemission excited with synchrotron radiation. The oxidation is spatially and chemically inhomogeneous, and both subsurface oxidation and multibonding geometries occur already at submonolayer coverages.

  • Received 1 August 1984

DOI:https://doi.org/10.1103/PhysRevB.30.4839

©1984 American Physical Society

Authors & Affiliations

G. Landgren*, R. Ludeke, J. F. Morar, Y. Jugnet, and F. J. Himpsel

  • IBM Thomas J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598

  • *Permanent address: Institute of Microwave Technology, S-100 44 Stockholm, Sweden.
  • Permanent address: Institute de Recherches sur la Catalyse, Centre National de la Recherche Scientifique, 2 Avenue Einstein, F-69626 Villeurbanne Cedex, France.

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Vol. 30, Iss. 8 — 15 October 1984

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