Sensitivity of defect energy levels to host band structures and impurity potentials in CdTe

A.-B. Chen and A. Sher
Phys. Rev. B 31, 6490 – Published 15 May 1985
PDFExport Citation

Abstract

The sensitivity of defect energy levels in semiconductors to the host band structures and impurity potentials has been studied for approximately 30 impurities in CdTe using four different band-structure models. The discrepancies in the defect levels between two different sets of band structures and impurity potentials are found to range from less than 0.1 eV to the whole band gap (1.6 eV). The band-structure effects are analyzed here in terms of detailed partial densities of states. Examples of contradictory predictions from different band structures are illustrated, and ways to improve the theory are suggested.

  • Received 10 December 1984

DOI:https://doi.org/10.1103/PhysRevB.31.6490

©1985 American Physical Society

Authors & Affiliations

A.-B. Chen

  • Physics Department, Auburn University, Auburn, Alabama 36849

A. Sher

  • SRI International, 333 Ravenswood Avenue, Menlo Park, California 94025

References (Subscription Required)

Click to Expand
Issue

Vol. 31, Iss. 10 — 15 May 1985

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×