Dimensionality crossover induced by a magnetic field in thin metallic films

Z. Ovadyahu, Yuval Gefen, and Yoseph Imry
Phys. Rev. B 32, 781 – Published 15 July 1985
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Abstract

The field dependence of the magnetoconductance in finite-geometry samples is analyzed within the framework of the localization theory. It is found that for high magnetic fields the magnetoconductance acquires the functional field dependence characteristic of a three-dimensional system. This is so even when the inelastic mean free path is much larger than the sample thickness and when the zero-field transport properties of the system are two dimensional in character. The crossover point is obtained once the radius of the Landau level becomes smaller than the sample thickness for both the parallel and the perpendicular field orientations. These theoretical considerations are borne out by experiments on indium oxide films.

  • Received 7 December 1984

DOI:https://doi.org/10.1103/PhysRevB.32.781

©1985 American Physical Society

Authors & Affiliations

Z. Ovadyahu

  • Department of Physics, Ben-Gurion University of the Negev, 84120 Beer-Sheva, Israel

Yuval Gefen and Yoseph Imry

  • School of Physics and Astronomy, Tel-Aviv University, 69978 Tel-Aviv, Israel

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Vol. 32, Iss. 2 — 15 July 1985

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